发明名称 SAMPLE TRANSFER DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a sample transfer device capable of inserting a sample to be observed and analyzed by irradiating a charged particle beam, into a charged particle beam apparatus, while a time exposed to the atmosphere is restrained to the minimum, and especially capable of working even in a case a working area in the vicinity of the device is restricted or a case a space for mounting a sample stand on a side entry type sample holder is narrow. SOLUTION: In the sample transfer device for transferring the sample to be observed and analyzed by irradiating the charged particle beam, the sample transfer device includes an expansible hollow member capable of internally storing the sample holder where the sample is mounted, a fixing member for fixing the sample holder inside the expansible hollow member, and a sealing member for opening and closing an opening communicating with the inside of the expansible hollow member and used for passing the sample holder. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011154917(A) 申请公布日期 2011.08.11
申请号 JP20100016146 申请日期 2010.01.28
申请人 HITACHI LTD 发明人 TERADA SHOHEI;HIRANO TATSUMI;WATABE KOICHI;WATANABE YASUICHIRO;KIYONO HIROMITSU
分类号 H01J37/20;H01L21/677 主分类号 H01J37/20
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