发明名称 APPARATUS AND METHOD FOR EVALUATION OF SUBSTRATE MOUNTING EQUIPMENT, AND SUBSTRATE FOR EVALUATION USED FOR THE SAME
摘要 PROBLEM TO BE SOLVED: To provide an apparatus and method for evaluation of substrate mounting equipment, capable of facilitating evaluation of a temperature adjustment function or the like of the substrate mounting equipment, depending on conditions or a situation to be evaluated, and to provide a substrate for evaluation used for the same. SOLUTION: The apparatus for evaluation of the substrate mounting equipment is provided for fixing a processed substrate placed on a mounting surface and for controlling the temperature thereof. The apparatus has an airtight chamber that can carry out depressurization, and allows the substrate mounting equipment to be installed, a substrate for evaluation which is mounted on the mounting surface instead of the processed substrate and includes a resistance heating body that carries out self heat generation, and a temperature measuring means that measures the temperature of the substrate for evaluation. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011155140(A) 申请公布日期 2011.08.11
申请号 JP20100015629 申请日期 2010.01.27
申请人 TOKYO ELECTRON LTD 发明人 SASAKI YASUHARU
分类号 H01L21/683 主分类号 H01L21/683
代理机构 代理人
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