发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE
摘要 There are provided a method of manufacturing a semiconductor device which achieves a reduction in implantation masks, and such a semiconductor device. By implanting boron into NMOS regions using a resist mask and another resist mask as the implantation masks, p-type impurity regions serving as the halo regions of access transistors and drive transistors are formed. By further implanting phosphorus or arsenic into a PMOS region using another resist mask as the implantation mask, n-type impurity regions serving as the halo regions of load transistors are formed.
申请公布号 US2011193173(A1) 申请公布日期 2011.08.11
申请号 US201113019600 申请日期 2011.02.02
申请人 RENESAS ELECTRONICS CORPORATION 发明人 NII KOJI;IGARASHI MOTOSHIGE
分类号 H01L27/088;H01L21/8234 主分类号 H01L27/088
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