发明名称 METHOD AND APPARATUS USED FOR THE PHYSICAL VALIDATION OF INTEGRATED CIRCUITS
摘要 The present invention involves a method and an apparatus used for the physical design validation of integrated circuits. Said method includes the following steps: the original circuit netlist of an integrated circuit and the layout data of said integrated circuit are compared; labels are assigned to the input and output terminals of the components in said integrated circuit based on the results of the comparison.
申请公布号 WO2011051797(A3) 申请公布日期 2011.08.11
申请号 WO2010IB02782 申请日期 2010.10.28
申请人 SYNOPSYS, INC.;KU, CHIU-YU 发明人 KU, CHIU-YU
分类号 G06F11/00;G06F17/50 主分类号 G06F11/00
代理机构 代理人
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