| 摘要 |
The apparatus for measurement of the topography of transparent surfaces is described. This is achieved by the observation and evaluation of patterns produced by optical beam emitted by projector, reflected from the measured surface, and projecting images on the screen. If the measured surface has photoelectric properties, then the same optical beam can be used to modulate the electrical currents and voltages measured in the measured material and produce spatially resolved data characterizing the photo-electric response of the sample.
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