发明名称 ANNEALING METHOD FOR CARRYING OUT ANNEALING STRUCTURE
摘要 PROBLEM TO BE SOLVED: To provide a method for annealing structure having at least a single wafer. SOLUTION: The annealing method has a first annealing step for bringing the structure into contact with a holder (312) at a first position, and annealing the structure in an oxidizing atmosphere so that an oxidized layer (310) is formed at least on a part of the exposed surface of the structure. The annealing method further has a step for changing the position of the structure on the holder at a second position where one or a plurality of contacting regions (314) are exposed between the structure in the course of the first annealing step and the holder; and a second annealing step where the structure is annealed at the second position in the oxidizing atmosphere. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011155261(A) 申请公布日期 2011.08.11
申请号 JP20110013116 申请日期 2011.01.25
申请人 SOITEC SILICON ON INSULATOR TECHNOLOGIES 发明人 SOUSBIE NICOLAS;ASPAR BERNARD;BARGE THIERRY;LAGAHE BLANCHARD CHRYSTELLE
分类号 H01L27/12;H01L21/02 主分类号 H01L27/12
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