发明名称 |
ANNEALING METHOD FOR CARRYING OUT ANNEALING STRUCTURE |
摘要 |
PROBLEM TO BE SOLVED: To provide a method for annealing structure having at least a single wafer. SOLUTION: The annealing method has a first annealing step for bringing the structure into contact with a holder (312) at a first position, and annealing the structure in an oxidizing atmosphere so that an oxidized layer (310) is formed at least on a part of the exposed surface of the structure. The annealing method further has a step for changing the position of the structure on the holder at a second position where one or a plurality of contacting regions (314) are exposed between the structure in the course of the first annealing step and the holder; and a second annealing step where the structure is annealed at the second position in the oxidizing atmosphere. COPYRIGHT: (C)2011,JPO&INPIT
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申请公布号 |
JP2011155261(A) |
申请公布日期 |
2011.08.11 |
申请号 |
JP20110013116 |
申请日期 |
2011.01.25 |
申请人 |
SOITEC SILICON ON INSULATOR TECHNOLOGIES |
发明人 |
SOUSBIE NICOLAS;ASPAR BERNARD;BARGE THIERRY;LAGAHE BLANCHARD CHRYSTELLE |
分类号 |
H01L27/12;H01L21/02 |
主分类号 |
H01L27/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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