| 发明名称 |
INSPECTION DEVICE AND METHOD OF INSPECTION |
| 摘要 |
<p>Disclosed is an inspection device (101) for inspecting an immunity property of an electronic device (151) in an inspection frequency range, wherein a first signal generator (111) and a second signal generator (112) generate a signal with a frequency which is included in a given signal frequency range. An adjusting unit (113) adjusts the difference between the frequency of the signal generated by the first signal generator (111) and the frequency of the signal generated by the second signal generator (112) so as to scan a desired inspection frequency range. An application unit (114) applies the signal generated by the first signal generator (111) and the signal generated by the second signal generator (112) to the electronic device (151) to be measured.</p> |
| 申请公布号 |
WO2011096054(A1) |
申请公布日期 |
2011.08.11 |
| 申请号 |
WO2010JP51503 |
申请日期 |
2010.02.03 |
| 申请人 |
NATIONAL INSTITUTE OF INFORMATION AND COMMUNICATIONS TECHNOLOGY;SETO SHINJI;SEKIGUCHI HIDENORI |
发明人 |
SETO SHINJI;SEKIGUCHI HIDENORI |
| 分类号 |
G01R31/30;G01R31/00 |
主分类号 |
G01R31/30 |
| 代理机构 |
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代理人 |
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| 主权项 |
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| 地址 |
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