发明名称 MEMORY DEVICE AND SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a memory device which can suppress power consumption, and a semiconductor device which uses the memory device. <P>SOLUTION: A transistor having an oxide semiconductor film used as an active layer is provided for each of memory cells of a memory device as a switching element for holding an electric charge accumulated in the transistor functioning as a memory element. The transistor as the memory element has a first gate electrode, a second gate electrode, a semiconductor film located between the first and second gate electrodes, a first insulating film located between the first gate electrode and the semiconductor film, a second insulating film located between the second gate electrode and the semiconductor film, and source and drain electrodes contacted with the semiconductor film. <P>COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011155255(A) 申请公布日期 2011.08.11
申请号 JP20100289073 申请日期 2010.12.27
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 SHIONOIRI YUTAKA;MIYAKE HIROYUKI;KATO KIYOSHI
分类号 H01L21/8242;G11C11/405;G11C16/04;H01L27/105;H01L27/108 主分类号 H01L21/8242
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