发明名称 DEVICE HAVING CONTACT BETWEEN SEMICONDUCTOR LAYERS THROUGH BURIED INSULATING LAYER, AND PROCESS FOR FABRICATING THE DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a line to be connected to a semiconductor region on a semiconductor device on an SeOI substrate in an easy method. <P>SOLUTION: According to a first aspect, the invention relates to a semiconductor device fabricated on the SeOI (semiconductor-on-insulator) substrate comprising a thin layer (1) of a semiconductor material separated from a base substrate (2) by means of a buried insulating layer (3, BOX), the device comprising a first conducting region (1, D1, S, E) in the thin layer and a second conducting region (5, BL, SL, lL) in the base substrate and being characterized by a contact (I1, I2, I<SB>N</SB>, I<SB>P</SB>) connecting the first region to the second region through the insulating layer. According to a second aspect, the invention relates to a process for fabricating a semiconductor device regarding the first aspect. <P>COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011155259(A) 申请公布日期 2011.08.11
申请号 JP20110004142 申请日期 2011.01.12
申请人 SOITEC SILICON ON INSULATOR TECHNOLOGIES 发明人 MAZURE CARLOS;PHELAN RICHARD
分类号 H01L21/8242;H01L21/329;H01L21/331;H01L21/336;H01L27/108;H01L29/73;H01L29/786;H01L29/861 主分类号 H01L21/8242
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