发明名称 METHOD OF PROCESSING SUBSTRATE
摘要 <p><P>PROBLEM TO BE SOLVED: To easily manufacture a thin semiconductor wafer in a relatively short time, prevent a crack of a substrate, and improve a production yield rate. <P>SOLUTION: A method of processing substrate includes the steps of: arranging a laser condensing unit 16 above a substrate 10 in a noncontact manner; irradiating a laser light onto a surface of the substrate 10 and condensing the laser light inside the substrate using the laser condensing unit 16; forming a two-dimensional interior reformed layer 12 inside the substrate 10 by relatively moving the laser condensing unit 16 and the substrate 10; forming at least one patterned reformed layer 36 on the side of the two-dimensional interior reformed layer 12 facing the laser condensing unit 16 or on an opposite side from the laser condensing unit 16 by relatively moving the laser condensing unit 16 and the substrate 10; exposing the patterned reformed layer 36 on the surface of the substrate 10; and etching the patterned reformed layer 36 and the two-dimensional interior reformed layer 12, wherein a relative moving direction of the laser condensing unit 16 and the substrate 10 is not same as a cleavage direction of the substrate 10. <P>COPYRIGHT: (C)2011,JPO&INPIT</p>
申请公布号 JP2011155070(A) 申请公布日期 2011.08.11
申请号 JP20100014529 申请日期 2010.01.26
申请人 SAITAMA UNIV;SHIN ETSU POLYMER CO LTD 发明人 IKENO JUNICHI;KUNISHI YOSUKE;SUZUKI HIDEKI
分类号 H01L21/304;B23K26/04;B23K26/08;B23K26/40 主分类号 H01L21/304
代理机构 代理人
主权项
地址