发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To obtain a capacitor insulating film having a crystal structure of high dielectric constant by reducing the effect of crystallinity of an underling film. SOLUTION: A method of manufacturing a semiconductor device includes an amorphous film formation step for forming an amorphous film 320 on a crystalline film 310 which is formed on a substrate 200 and a crystalline insulating film formation step for forming an insulating film 330 having a crystal structure controlled independently from the crystal structure of the crystalline film 310 on the amorphous film 320. The crystalline insulating film formation step includes a phase transition step for causing phase transition of at least a part of the insulating film 330 to the tetragonal system by heating the substrate 200. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011155033(A) 申请公布日期 2011.08.11
申请号 JP20100013863 申请日期 2010.01.26
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 ASHITANI ATSUHIKO;TAKEBAYASHI YUJI;SAKAI MASANORI;OGURA SHINTARO
分类号 H01L21/316;C23C16/40;C23C16/56;H01L21/31;H01L21/8242;H01L21/8247;H01L27/108;H01L27/115;H01L29/78;H01L29/788;H01L29/792 主分类号 H01L21/316
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