发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To obtain a capacitor insulating film having a crystal structure of high dielectric constant by reducing the effect of crystallinity of an underling film. SOLUTION: A method of manufacturing a semiconductor device includes an amorphous film formation step for forming an amorphous film 320 on a crystalline film 310 which is formed on a substrate 200 and a crystalline insulating film formation step for forming an insulating film 330 having a crystal structure controlled independently from the crystal structure of the crystalline film 310 on the amorphous film 320. The crystalline insulating film formation step includes a phase transition step for causing phase transition of at least a part of the insulating film 330 to the tetragonal system by heating the substrate 200. COPYRIGHT: (C)2011,JPO&INPIT |
申请公布号 |
JP2011155033(A) |
申请公布日期 |
2011.08.11 |
申请号 |
JP20100013863 |
申请日期 |
2010.01.26 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC |
发明人 |
ASHITANI ATSUHIKO;TAKEBAYASHI YUJI;SAKAI MASANORI;OGURA SHINTARO |
分类号 |
H01L21/316;C23C16/40;C23C16/56;H01L21/31;H01L21/8242;H01L21/8247;H01L27/108;H01L27/115;H01L29/78;H01L29/788;H01L29/792 |
主分类号 |
H01L21/316 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|