发明名称 Semiconductor memory device, method of manufacturing the same, and method of screening the same
摘要 A memory cell comprises a variable resistance film; a first conductive film having one surface contacted with one surface of the variable resistance film; and a second conductive film having one surface contacted with another surface of the variable resistance film. A width of the first conductive film or the second conductive film in a direction orthogonal to a direction that a current flows in the first conductive film or the second conductive film is smaller than a width of the variable resistance film in a direction orthogonal to a direction that a current flows in the variable resistance film. The width of the first conductive film and the second conductive film is smaller than a width of the first line and the second line in a direction orthogonal to a direction that a current flows in the first line and the second line.
申请公布号 US7995374(B2) 申请公布日期 2011.08.09
申请号 US20090618122 申请日期 2009.11.13
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 KOMURA MASANORI;SATO MITSURU;MUROOKA KENICHI;KISHIDA MOTOYA
分类号 G11C11/00;G11C11/36;G11C17/00;G11C29/00 主分类号 G11C11/00
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