发明名称 |
System and method for inspection of parts with an eddy current probe |
摘要 |
An inspection system for detecting a flaw in a part is provided. The inspection system includes a generally C-shaped core having an opening for receiving the part. The system also includes a driver coil wrapped around the core for creating a magnetic field in the opening. The system further includes at least one single element or multiple element eddy current sensor disposed in the opening.
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申请公布号 |
US7994780(B2) |
申请公布日期 |
2011.08.09 |
申请号 |
US20070855816 |
申请日期 |
2007.09.14 |
申请人 |
GENERAL ELECTRIC COMPANY |
发明人 |
SUN HAIYAN;WANG CHANGTING;MCKNIGHT WILLIAM STEWART |
分类号 |
G01N27/82 |
主分类号 |
G01N27/82 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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