发明名称 NONVOLATILE MEMORY DEVICE AND READ METHOD THEREOF
摘要 PURPOSE: A non-volatile memory device and a method of reading thereof are provided to prevent the extension of threshold voltage distribution of a memory cell through the noise voltage of a common source line. CONSTITUTION: In a non-volatile memory device and a method of reading thereof, a plurality of memory cells are serially connected between a bit line and a common source line. A plurality of word lines is respectively connected to the gate of a plurality of memory cells. A common source line voltage sensor is connected to the common source line. The common source line voltage sensor senses a common source line voltage. A common source line compensation logic(170) adjusts a detected common source line voltage. The common source line compensation logic varies the voltage supplied to the bit line or the word lines.
申请公布号 KR20110089729(A) 申请公布日期 2011.08.09
申请号 KR20100009251 申请日期 2010.02.01
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, BO GEUN
分类号 G11C16/34;G11C16/08;G11C16/24;G11C16/30 主分类号 G11C16/34
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