发明名称 |
NONVOLATILE MEMORY DEVICE AND READ METHOD THEREOF |
摘要 |
PURPOSE: A non-volatile memory device and a method of reading thereof are provided to prevent the extension of threshold voltage distribution of a memory cell through the noise voltage of a common source line. CONSTITUTION: In a non-volatile memory device and a method of reading thereof, a plurality of memory cells are serially connected between a bit line and a common source line. A plurality of word lines is respectively connected to the gate of a plurality of memory cells. A common source line voltage sensor is connected to the common source line. The common source line voltage sensor senses a common source line voltage. A common source line compensation logic(170) adjusts a detected common source line voltage. The common source line compensation logic varies the voltage supplied to the bit line or the word lines. |
申请公布号 |
KR20110089729(A) |
申请公布日期 |
2011.08.09 |
申请号 |
KR20100009251 |
申请日期 |
2010.02.01 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, BO GEUN |
分类号 |
G11C16/34;G11C16/08;G11C16/24;G11C16/30 |
主分类号 |
G11C16/34 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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