发明名称 APPARATUS AND METHOD FOR DETERMINING THE RELATIVE RATIO OF THE SEMICONDUCTING/METALLIC CARBON NANOTUBES OF CARBON NANOTUBE NETWORK TRANSISTOR, AND A MEDIUM HAVING COMPUTER READABLE PROGRAM FOR EXECUTING THE METHOD
摘要 PURPOSE: An apparatus for measuring the ratio of metallic and semiconductive CNT(Carbon Nanotube) in a carbon nanotube network transistor and a method thereof and media recording program for reading with a computer capable of implementing the method thereof are provided to quantitatively recognize the rate of the metallic and semiconductive CNT in a carbon nanotube network transistor with low cost and little time. CONSTITUTION: A transistor voltage measurement unit applies a predetermined voltage for measuring the resistance of a transistor in a bridge circuit and measures voltages between a source drain of each transistor in case the gate voltage of the transistor is applied or not. A carbon nanotube rate output unit produces the rate of the metallic and semiconductive CNT in the carbon nanotube network transistor using the rate of source drain voltage in the measured transistor and the preset relation between the rate of the metallic and semiconductive CNT in the carbon nanotube network transistor and the rate of the measured voltages.
申请公布号 KR101054309(B1) 申请公布日期 2011.08.08
申请号 KR20100053466 申请日期 2010.06.07
申请人 KOREA UNIVERSITY RESEARCH AND BUSINESS FOUNDATION 发明人 KIM, GYU TAE;KANG, PIL SOO;JOO, MIN KYU;KIM, YON HA
分类号 H01L21/66 主分类号 H01L21/66
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