| 摘要 |
<p>The method involves choosing q linear combinations of p tests carried out by establishing a generalized principal component analysis, with a choice of metrics adapted to the p tests of n electronic components. Linear projections of data are searched on one or two dimensions that highlight atypical observations, and a projection index is defined, where the projection index measures a projection value, and is higher than atypical highlighting projection. Projections corresponding to local maxima of the projection index are searched.</p> |
