发明名称 |
METHOD AND APPARATUS FOR SELECTING VOLTAGE AND FREQUENCY LEVELS FOR USE IN AT-SPEED TESTING |
摘要 |
In one embodiment, the invention is a method and apparatus for selecting voltage and frequency levels for use in at-speed testing. One embodiment of a method for selecting a set of test conditions with which to test an integrated circuit chip includes formulating a statistical optimization problem and obtaining a solution to the statistical optimization problem, where the solution is the set of test conditions.
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申请公布号 |
US2011191055(A1) |
申请公布日期 |
2011.08.04 |
申请号 |
US20100696902 |
申请日期 |
2010.01.29 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
MARTINEZ JOSE;VISWESWARIAH CHANDRAMOULI;WOYTOWICH FRANCIS;XIONG JINJUN |
分类号 |
G06F19/00;G01R31/00;G06F17/18 |
主分类号 |
G06F19/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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