发明名称 APPEARANCE INSPECTION APPARATUS AND APPEARANCE INSPECTION METHOD
摘要 <p><P>PROBLEM TO BE SOLVED: To automatically and accurately set an inspection window. <P>SOLUTION: An appearance inspection apparatus 10 inspects an inspection object 12 using an inspection object image obtained, by imaging the inspection object 12 with a substrate and components mounted to the substrate. The appearance inspection apparatus 10 includes a projection unit 26 for projecting a pattern to the inspection object 12; a height measurement section 32 for generating height information on a surface of the inspection object 12, based on a pattern image of the inspection object 12, to which the pattern is projected; an inspection data processing section 34 for setting the inspection window in the inspection object image, based on a layout of the components on the inspection object image identified by using the height information. <P>COPYRIGHT: (C)2011,JPO&INPIT</p>
申请公布号 JP2011149736(A) 申请公布日期 2011.08.04
申请号 JP20100009342 申请日期 2010.01.19
申请人 SAKI CORP:KK 发明人 TANAKA HIDEAKI;CHIKURA MASAYA
分类号 G01B11/02;G01N21/956;H05K13/08 主分类号 G01B11/02
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