发明名称 LED TESTING AND TAPING APPARATUS
摘要 PURPOSE: A light emitting diode inspection and integrated taping apparatus are provided to classify grades of light emitting diodes and perform taping with one apparatus, thereby reducing unit price with high efficiency. CONSTITUTION: An approximately hemisphere shaped supplying part(10) includes a vibrating body(11) arraying an inputted light emitting diode(1). The supplying part successively moves the light emitting diode along a guide rail(13). A first placing means places the light emitting diode supplied in a row through the guide rail one by one in a mounting groove(31) by vacuum suction. An index rail(30) transfers the placed light emitting diode in the mounting groove by the first placing means. A grade classification part(40) classifies a grade by determining a state of the light emitting diode by applying a electric signal to the transferred light emitting diode by the index rail. More than one taping part(50) performs taping separately for each grade with respect to the graded light emitting diode in the grade classification part. A residual exhausting part(60) discharges the light emitting diode which is not included in a graded range for the taping.
申请公布号 KR20110088701(A) 申请公布日期 2011.08.04
申请号 KR20100008324 申请日期 2010.01.29
申请人 AP TECH CO., LTD. 发明人 JU, JAE CHEOL;PARK, CHUN YONG;HEO, YEONG CHEOL;KWUN, OH CHUL
分类号 G01R31/01;G01R31/00 主分类号 G01R31/01
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