发明名称 METHOD AND APPARATUS FOR DETERMINING A ROBUSTNESS METRIC FOR A CIRCUIT DESIGN
摘要 Some embodiments provide techniques and systems for determining a change indicator for an endpoint, a pathgroup, a design, and/or a flow. The system can determine base critical path delays and base slacks for the endpoints in a base implementation of the circuit design. The system can then determine the new critical path delays and new slacks for the endpoints in a new implementation of the circuit design. Next, the system determines slack differences for the endpoints using the new slacks and the base slacks. Finally, for each endpoint, the system can determine an endpoint change indicator using the associated slack difference, the base critical path delay, and the new critical path delay. A pathgroup change indicator can be determined using endpoint change indicators. A design change indicator can be determined using pathgroup change indicators or scenario change indicators. A design flow change indicator can be determined using design change indicators.
申请公布号 US2011191732(A1) 申请公布日期 2011.08.04
申请号 US20100697088 申请日期 2010.01.29
申请人 SYNOPSYS, INC. 发明人 IYER MAHESH A.;MOTTAEZ AMIR H.
分类号 G06F17/50 主分类号 G06F17/50
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