发明名称 REFLECTANCE PROPERTY MEASUREMENT DEVICE AND REFLECTION PROPERTY MEASUREMENT SYSTEM
摘要 <p>As an example of the disclosed reflectance property measurement device, a color density meter (10) is provided with: a polarizing plate (5a); and a phase-shift plate (5b) that is disposed between the polarizing plate (5a) and a sample surface (1s), and wherein the sum of the phase change of a transmitted illumination light beam and the phase change of an incoming light beam is 1/2 wavelengths. As a result, the color density meter (10), as an example of the reflectance property measurement device having this kind of a configuration, is easy to handle, has a compact configuration, and can measure reflectance properties from which surface-reflected light has been eliminated or added.</p>
申请公布号 WO2011093024(A1) 申请公布日期 2011.08.04
申请号 WO2011JP00199 申请日期 2011.01.17
申请人 KONICA MINOLTA SENSING, INC.;IMURA, KENJI 发明人 IMURA, KENJI
分类号 G01N21/47;G01N21/27 主分类号 G01N21/47
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