METHOD FOR ESTIMATING DEFECTS IN AN OBJECT AND DEVICE FOR IMPLEMENTING SAME

摘要

The invention relates to a device and method for estimating defects potentially present in an object (10) comprising an outer surface (18), wherein the method comprises the steps of: a) illuminating the outer surface of the object with an inductive wave field (14) at a predetermined frequency; b) measuring an induced wave field (I) at the outer surface of the object; c) developing from the properties of the object's material a coupling matrix T associated with a depth Z of the object from the outer surface; d) solving the matrix system (II) in order to determine a vector (III) at depth Z; e) extracting a sub-vector (IV) from the vector (III) corresponding to a potential defect on the object at depth Z; and f) quantitatively estimating the potential defect from the sub-vector (IV) at depth Z.