| 摘要 |
<p>Disclosed is an automatic analyzing device which comprises a sample container (2) that accommodates a sample (1) to be measured; a dispensing probe (5) that dispenses the sample (2) to be measured; and a conductive chip (11) that is detachably mounted on a portion of the dispensing probe (5), the portion to be soaked in the sample (2) to be measured. An electrostatic capacitance between the chip (11) of the dispensing probe (5) and a ground potential (9) serving as a reference potential provided for the automatic analyzing device in advance is detected, and the mounted state of the chip (11) on the dispensing probe (5) is determined on the basis of the detected result. With this, the automatic analyzing device can quickly detect the chip dropping off the probe.</p> |
