发明名称 PROBE CLEANING UNIT, AND PANEL INSPECTION DEVICE AND PROBE CLEANING METHOD HAVING THE SAME
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a probe cleaning unit that selects only a probe assembly having a probe requiring cleaning and efficiently cleans the probe by easy operation. <P>SOLUTION: This probe cleaning unit includes an arm section movably attached to a probe unit of a panel inspection device between positions corresponding to at least the probe assemblies, a body section attached to the arm section, a moving base supported by the body section linearly reciprocatably, a means for linearly reciprocating the moving base with respect to the body section, and a distance adjusting mechanism for adjusting the distance between the arm section and the moving base so that a first cleaning means attached to the moving base comes into contact with the tips of a plurality of probes of the probe assemblies when the moving base is linearly reciprocated with respect to the body section. <P>COPYRIGHT: (C)2011,JPO&INPIT</p>
申请公布号 JP2011149917(A) 申请公布日期 2011.08.04
申请号 JP20100058669 申请日期 2010.03.16
申请人 MICRONICS JAPAN CO LTD 发明人 MIURA KAZUYOSHI;OSANAI YASUAKI;SAWADA TAKESHI;YAMAGUCHI TSUNE;KUGA TOMOAKI;KIYONO YOJI
分类号 G01R31/00;B08B1/00;G01R1/06;G01R31/28;G02F1/13;G02F1/1362;G09F9/00 主分类号 G01R31/00
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