发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT, AND ELECTRONIC DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an adaptive voltage scaling technique taking both systematic variability and random uncertainty into consideration. SOLUTION: A detection circuit optimum for each type of process variation is set, in a system constitution for performing adaptive voltage scaling. Namely, a first measuring circuit (100) which generates a relative value for a mean value of gate delay is installed for systematic variability detection, and a second measuring circuit (200) which generates a relative value for a standard deviation in gate delay is installed for random uncertainty detection individually. Control information (VCNT) for determining a supply voltage is generated on the basis of the relative values generated by the measuring circuits. Here, the control information is generated by reference to, for example, table data. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011151309(A) 申请公布日期 2011.08.04
申请号 JP20100013304 申请日期 2010.01.25
申请人 RENESAS ELECTRONICS CORP 发明人 OTSUGA KAZUO;SUGANO YUSUKE;TAKAZAWA YOSHIO
分类号 H01L27/04;G01R31/28;H01L21/822 主分类号 H01L27/04
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