发明名称 BATCH TYPE ATOMIC LAYER DEPOSITING APPARATUS
摘要 PURPOSE: An apparatus for a batch type atomic layer deposition is provided to supply excellent throughput by processing a plurality of substrates in a batch type at a time. CONSTITUTION: A chamber forms vacuum inside. A first reactive gas layer forming part(30) is arranged inside the chamber and forms a first reactive gas layer. A purge gas layer forming part(40) is arranged in the inside of the chamber and forms a purge gas layer with the first reactive gas layer side by side. A second reaction gas layer formation part(50) is arranged in the inside of the chamber and forms a second reaction gas layer with the purge gas layer side by side. A substrate moving method(20) moves a substrate to successively pass the first reactive gas layer, the purge gas layer, and the second reaction gas layer.
申请公布号 KR20110087580(A) 申请公布日期 2011.08.03
申请号 KR20100007065 申请日期 2010.01.26
申请人 SHIN, WOONG CHUL 发明人 SHIN, WOONG CHUL
分类号 H01L21/205 主分类号 H01L21/205
代理机构 代理人
主权项
地址