Contact probe for a testing head having vertical probes with improved scrub movement

摘要

Herein described is a testing head (10) with vertical probes of the type comprising at least a first and a second plate-shaped supports (2,3) provided with at least one guide hole (4,5) for the accommodation of at least one contact probe (16;30;60), the contact probe (16;30;60) having an extended body of preset longitudinal axis (H) comprising an intermediate portion (17) intended to be in peripheral contact with a guide wall (4A) of the guide hole (4) of at least one support (2) and an end portion (20) adapted to ensure mechanical and electrical contact with a corresponding contact pad (8) of an electronic device to be tested, said testing head (10) being characterised in that said intermediate portion (17) comprises a substantially cam-shaped section (22;32;62) whose profile engages with said guide wall (4A) in such a manner to cause a transverse and/or rotation movement (s) to scrub said contact pad (8) by means of said end portion (20), due to the vertical movement of said at least one contact probe triggered by a force operating on it in an axial direction.