发明名称 |
INLINE COMPUTED TOMOGRAPHY INSPECTION SYSTEM AND METHOD USING THE SAME |
摘要 |
PURPOSE: Inline CT inspection system and method are provided to reduce inspection hours by partial scanning of a target and parallel processing of partial image data taken through the scanning by a plurality of cores in a parallel processing unit. CONSTITUTION: An inline CT inspection system comprises a CT unit(30), an image processing unit(95), a loading unit(10), an unloading unit(70) and a control unit(90). The CT unit takes CT images of a target, an electronic part, such as semiconductor. The image processing unit parallel-processes a plurality of partial image data taken by the CT unit, with a plurality of cores in a parallel processing unit. The image processing unit re-organizes the parallel-processed data as tomography images. The image processing unit corrects slope of the tomography image, compares the images with pre-stored standard images and determines quality of the target.
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申请公布号 |
KR20110088139(A) |
申请公布日期 |
2011.08.03 |
申请号 |
KR20100007902 |
申请日期 |
2010.01.28 |
申请人 |
SEC CO., LTD. |
发明人 |
KIM, YOUNG MAN;KIM, SUN TAEK;CHOI, KWANG NAM;YOON, YEO SONG;PARK, BYUNG JUN;OH, HYUN MYUNG;RYU, KI UNG;KIM, JONG HYUN |
分类号 |
G01B11/24;H05K13/08 |
主分类号 |
G01B11/24 |
代理机构 |
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代理人 |
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主权项 |
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