发明名称 Photomask including ion trapping layer and method of manufacturing semiconductor device using the photomask
摘要 A photomask includes an ion trapping layer and a method of manufacturing a semiconductor device uses the photomask. The photomask includes a transparent substrate and an ion trapping layer formed on a first region of the transparent substrate to trap ions present near the transparent substrate. In manufacturing a semiconductor device, a photosensitive film formed on a substrate is exposed through the photomask in which the ion trapping layer is formed on the transparent substrate, and the substrate is processed using the photosensitive film obtained as the result of the exposure.
申请公布号 US7989123(B2) 申请公布日期 2011.08.02
申请号 US20090456500 申请日期 2009.06.17
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE HAN-SHIN;CHOI JAE-HYUCK;JEONG HAE-YOUNG;KO HYUNG-HO;JUNG JIN-SIK;OH JONG-KEUN;KANG SOO-JUNG
分类号 G03F1/00 主分类号 G03F1/00
代理机构 代理人
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