发明名称 |
System and method of measuring and mapping three dimensional structures |
摘要 |
A system for mapping a three-dimensional structure includes a projecting optical system adapted to project light onto an object, a correction system adapted to compensate the light for at least one aberration in the object, an imaging system adapted to collect light scattered by the object and a wavefront sensor adapted to receive the light collected by the imaging system and to sense a wavefront of the received light. For highly aberrated structures, a number of wavefront measurements are made which are valid over different portions of the structure, and the valid wavefront data is stitched together to yield a characterization of the total structure.
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申请公布号 |
US7988292(B2) |
申请公布日期 |
2011.08.02 |
申请号 |
US20090474607 |
申请日期 |
2009.05.29 |
申请人 |
AMO WAVEFRONT SCIENCES LLC. |
发明人 |
NEAL DANIEL R.;COPLAND RICHARD JAMES;NEAL DAVID A. |
分类号 |
A61B3/10;A61B3/103;A61B3/11;A61B3/113;A61B3/12;A61B3/15 |
主分类号 |
A61B3/10 |
代理机构 |
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地址 |
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