发明名称 Nonvolatile memory device and method for manufacturing the same
摘要 The present invention discloses a nonvolatile memory device which can improve the data storage capacity without increasing the surface area of the device, and a method for manufacturing the same. The nonvolatile memory device comprises: a gate of a stack type structure formed on an active region of a semiconductor substrate; a source/drain formed in the substrate at both sides of the gate of the stack type structure; an interlayer insulating film formed on the substrate where the source/drain is formed and covering the gate of the stack type structure; a contact connected to the source/drain through the interlayer insulating film; a plurality of conductive patterns formed in the interlayer insulating film of the region not adjacent to the contact; and an electrode pad formed on the conductive patterns.
申请公布号 US7989874(B2) 申请公布日期 2011.08.02
申请号 US20060275494 申请日期 2006.01.10
申请人 MAGNACHIP SEMICONDUCTOR, LTD. 发明人 LEE DA-SOON
分类号 H01L23/52;H01L29/788;H01L21/3205;H01L21/336;H01L21/8247;H01L27/115;H01L29/76;H01L29/792 主分类号 H01L23/52
代理机构 代理人
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