发明名称 |
ENHANCEMENT OF EDDY CURRENT BASED MEASUREMENT CAPABILITIES |
摘要 |
A METHOD AND AN APPARATUS FOR ENHANCEMENT OF THE EDDY CURRENT FOR MEASURING RESISTANCE-BASED FEATURES OF A SUBSTRATE IS PROVIDED. THE APPARATUS INCLUDES A SENSOR (210) CONFIGURED TO DETECT A SIGNAL PRODUCED BY AN EDDY CURRENT GENERATED ELECTROMAGNETIC FIELD. THE MAGNETIC FIELD ENHANCING SOURCE (218) IS POSITIONED TO THE ALTERNATIVE SIDE OF THE OBJECT UNDER MEASUREMENT RELATIVE TO THE SENSOR (210) TO ENABLE THE SENSITIVITY ENHANCING ACTION. THE SENSITIVITY ENHANCING SOURCE INCREASES THE INTENSITY OF THE EDDY CURRENT GENERATED IN THE OBJECT UNDER MEASUREMENT, AND AS A RESULT THE SENSITIVITY OF THE SENSOR (210). A SYSTEM ENABLED TO DETERMINE A THICKNESS OF A LAYER AND A METHOD FOR DETERMINING A RESISTANCE-BASED FEATURE CHARACTERISTIC ARE ALSO PROVIDED.
|
申请公布号 |
MY143920(A) |
申请公布日期 |
2011.07.29 |
申请号 |
MYPI20033622 |
申请日期 |
2003.09.23 |
申请人 |
LAM RESEARCH CORPORATION |
发明人 |
YEHIEL GOTKIS;RODNEY KISTLER;ALEKSANDER OWCZARZ;DAVID HEMKER;NICOLAS J. BRIGHT |
分类号 |
G01B7/06;G01N27/02;H01L21/302;H01L21/461 |
主分类号 |
G01B7/06 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|