| 摘要 |
An apparatus, system and method are provided for testing a battery-powered electronic device-under-test in a transport frame engaged with a test fixture. A transport frame power supply is arranged to provide power to the DUT in a pre-testing stage. A switching circuit is arranged to switch from the transport frame power supply to a test fixture power supply in response to receiving a power switching signal indicating satisfaction of a pre-testing condition. Power from the test fixture power supply can then be switched back to the first transport frame, or to a second transport frame, to begin testing a second DUT. The ability to start a DUT test without having to wait for the DUT to boot-up in the test fixture reduces test time and increases efficiency of use of test equipment.
|
