| 摘要 |
Provided is a method for determining the presence of an alumina layer on a surface of a component. The method includes illuminating a surface of a component with radiation; detecting radiation emitted at a particular wavelength; analyzing the detected radiation; to determine the thickness of the alumina at at least one point on the surface of the component; and comparing the determined thickness of the alumina at the at least one point on the surface of the component with a predetermined thickness of alumina at that point to decide if the thickness of alumina at the at least one point on the surface of the component is satisfactory.
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