发明名称 METHOD AND APPARATUS FOR DIVIDING SEMICONDUCTOR WAFER
摘要 PROBLEM TO BE SOLVED: To provide a method and an apparatus for dividing a semiconductor wafer that can securely and speedily divide the semiconductor wafer and is effective even if a pellet size is small. SOLUTION: The present invention relates to the method for dividing the semiconductor wafer which is characterized by forming a brittle portion L extending along a line of division into pellets on the semiconductor wafer W, applying the semiconductor wafer W to a support member 1 having a sharp edge 12 formed at one end edge of a contact surface 11, pressing the semiconductor wafer W by a roller 3 at a position opposed to the edge 12, and cleaving the semiconductor wafer W in sequence at the part of the brittle portion while moving the semiconductor wafer W continuously in a feed direction relatively to the support member 1 and the roller 3. The apparatus for implementing the method is also provided. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011146424(A) 申请公布日期 2011.07.28
申请号 JP20100003888 申请日期 2010.01.12
申请人 CANON MACHINERY INC 发明人 NAKATSU AKIRA
分类号 H01L21/301;B28D5/00 主分类号 H01L21/301
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