发明名称 GENERATION METHOD FOR TEST TASK USED IN LOGIC VERIFICATION OF SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 PROBLEM TO BE SOLVED: To reproduce trouble having occurred in hardware model simulation in logic verification with small man-hours, in verification work of an SoC (System on Chip) device. SOLUTION: A software model of the SoC device is operated according to a test program having made the trouble occur in the hardware model simulation, and memory access, an update wait of a memory, register access, and an update wait of a register occurring in a process of the operation are recorded in a log in order of the occurrence while each of them is converted into an RTL (Register Transfer Logic). The logic verification is executed with the log as a test task. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011145880(A) 申请公布日期 2011.07.28
申请号 JP20100005992 申请日期 2010.01.14
申请人 YAMAHA CORP 发明人 INAGAKI TATSUYA
分类号 G06F17/50;G01R31/28 主分类号 G06F17/50
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