发明名称 STRUCTURE AND FABRICATION OF FIELD-EFFECT TRANSISTOR HAVING SOURCE/DRAIN EXTENSION DEFINED BY MULTIPLE LOCAL CONCENTRATION MAXIMA
摘要 <p>An insulated-gate field-effect transistor (100W) has a source (980) and a drain (242) laterally separated by a channel zone (244) of body material (180) of a semiconductor body. A gate electrode (262) overlies a gate dielectric layer (260) above the channel zone. A more heavily doped pocket portion (250) of the body material normally extends largely along only the source so that the IGFET is an asymmetric device. The source has a main source portion (980M) and a more lightly doped lateral source extension (980E). The semiconductor dopant which defines the source reaches multiple local concentration maxima in defining the source extension. The procedure involved in defining the source extension with semiconductor dopant that reaches two such local concentration maxima enables source/drain extensions of mutually different characteristics for three insulated-gate field-effect transistors to be defined in only two source/drain-extension doping operations.</p>
申请公布号 WO2010110900(A8) 申请公布日期 2011.07.28
申请号 WO2010US00896 申请日期 2010.03.25
申请人 NATIONAL SEMICONDUCTOR CORPORATION 发明人 FRENCH, WILLIAM, D.;BULUCEA, CONSTANTIN
分类号 H01L21/70;H01L29/02;H01L29/10 主分类号 H01L21/70
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