SEMICONDUCTOR DEVICE, SEMICONDUCTOR DEVICE TESTING METHOD, AND DATA PROCESSING SYSTEM

摘要

PROBLEM TO BE SOLVED: To perform a confirmation test in which a large difference between AC characteristics does not exist in a plurality of current passes concerned in a plurality of through electrodes between an interface chip and a core chip respectively in a semiconductor device of a type using the interface chip.

SOLUTION: The semiconductor device has the interface chip and the core chip, and a measurement-target signal line 130 and a reference signal line 131 which electrically connect the interface chip and the core chip and each of which includes a through electrode. The interface chip sends out a test clock generated with a signal generation circuit 100 to the core chip. The core chip generates a predetermined measurement signal from the test clock with a signal generation circuit 101 and simultaneously sends out the predetermined measurement signal to the measurement-target signal line 130 and the reference signal line 131. Furthermore, the interface chip detects a phase difference between a plurality of the predetermined measurement signals input through the measurement-target signal line 130 and the reference signal line 131 with an operational amplifier 117, and a determination circuit 102 outputs a test result.

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