发明名称 METHOD OF MANUFACTURING FIELD EFFECT TRANSISTOR, METHOD OF MANUFACTURING DISPLAY DEVICE, METHOD OF MANUFACTURING X-RAY IMAGING DEVICE, AND METHOD OF MANUFACTURING OPTICAL SENSOR
摘要 PROBLEM TO BE SOLVED: To improve transistor characteristics while lowering a temperature of a heat treatment. SOLUTION: A field effect transistor is manufactured through a process of forming an active layer made of an amorphous oxide semiconductor containing In, Ga and Zn whose composition ratio is denoted by In:Ga:Zn=a:b:c, a, b, c satisfying relations of a+b=2, 1.2<b<2 and 1≤c≤2, and a process of heat-treating the active layer at≤240°C. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011146525(A) 申请公布日期 2011.07.28
申请号 JP20100006043 申请日期 2010.01.14
申请人 FUJIFILM CORP 发明人 HAMA IFUMI;TANAKA ATSUSHI;SUZUKI MASAYUKI
分类号 H01L21/336;H01L29/786;H01L51/50 主分类号 H01L21/336
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