发明名称 Probe head and method of fabricating the same
摘要 Provided is a probe head and a method of fabricating the same. The probe head includes a sensor unit having: as sensor (140) which records or reads data on or from a predetermined medium (200); first (120) and second (140) shields disposed on both sides of the sensor (140) at a predetermined distance from each other; and first (130) and second (150) intermediate layers respectively interposed between the sensor and the first shield (120), and the sensor (140) and the second shield (140). The method includes: providing a substrate (101); forming an insulating layer (110) on the substrate (101); forming a first shield (120) on the insulating layer (110); forming a first (130) intermediate layer on the first shield (120); forming a sensor (140) on the first intermediate layer (130); forming a second intermediate layer (150) on the sensor (140); forming a second shield (140) on the second intermediate layer (150); and forming a protective layer (190) on the second shield (140). A metal layer (160) connecting the sensor (140) to a power source is formed on the second intermediate layer (150) with a third intermediate layer (170) on it. Accordingly, the resolving ability and sensitivity of the probe head can be simultaneously improved, and the probe head can be easily manufactured.
申请公布号 EP2348505(A1) 申请公布日期 2011.07.27
申请号 EP20110158525 申请日期 2005.11.21
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 NAM, YUN-WOO;KIM, YONG-SU
分类号 G11B5/39;G01R1/06;G11B5/11;G11B5/31;G11B5/33;G11B9/14 主分类号 G11B5/39
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