| 摘要 |
A device and method of determining the electrical properties of an electrical device, including taking of at least one measurement of an electrical measured quantity at one or more brought-out electrical connections of each of several equipotential bodies of the electrical device, wherein measurement of the electrical measured quantity of certain equipotential bodies on at least one other brought-out electrical connection of the equipotential body concerned is not performed if a defect, which if appropriate is to be detected, of the relevant equipotential body in the area of this other connection, influences the electrical measured quantity more strongly than a tolerance of the measurement of this measured quantity. |
