发明名称 METHOD FOR MANUFACTURING NOR-TYPE NON-VOLATILE MEMORY DEVICE
摘要 <p>PURPOSE: A method for manufacturing a nor-type flash memory device is provided to diffuse implanted impurities through a heating process, thereby forming an impurity area under floating poly silicon after floating poly silicon is formed. CONSTITUTION: A first conductive film is formed on a substrate. First hard mask patterns(132) are in parallel in y direction on the first conductive film. The first conductive film is selectively eliminated to form first conductive patterns. The surface of a substrate is exposed between first conductive patterns by first trenches. A photo resist pattern opens one first trench. An impurity extension area(152) is expanded in x direction of the substrate. First hard mask patterns are selectively eliminated by an etching mask to form second trenches(164).</p>
申请公布号 KR20110085502(A) 申请公布日期 2011.07.27
申请号 KR20100005332 申请日期 2010.01.20
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 SONG, YOUNG SOO;SHIN, JOONG SHIK
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
代理机构 代理人
主权项
地址