发明名称 |
METHOD FOR MANUFACTURING NOR-TYPE NON-VOLATILE MEMORY DEVICE |
摘要 |
<p>PURPOSE: A method for manufacturing a nor-type flash memory device is provided to diffuse implanted impurities through a heating process, thereby forming an impurity area under floating poly silicon after floating poly silicon is formed. CONSTITUTION: A first conductive film is formed on a substrate. First hard mask patterns(132) are in parallel in y direction on the first conductive film. The first conductive film is selectively eliminated to form first conductive patterns. The surface of a substrate is exposed between first conductive patterns by first trenches. A photo resist pattern opens one first trench. An impurity extension area(152) is expanded in x direction of the substrate. First hard mask patterns are selectively eliminated by an etching mask to form second trenches(164).</p> |
申请公布号 |
KR20110085502(A) |
申请公布日期 |
2011.07.27 |
申请号 |
KR20100005332 |
申请日期 |
2010.01.20 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
SONG, YOUNG SOO;SHIN, JOONG SHIK |
分类号 |
H01L27/115;H01L21/8247 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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