发明名称 SEMICONDUCTOR DIE SINGULATION METHOD
摘要 PURPOSE: A semiconductor die singulation method is provided to completely penetrate a semiconductor wafer to etch openings, thereby increasing the number of semiconductor dies on a wafer. CONSTITUTION: A semiconductor substrate includes a plurality of semiconductor dies(42,44,46) which is separated by parts of a semiconductor wafer where singulation lines are formed. A singulation mask layer is placed on the semiconductor dies. An opening penetrates the singulation mask layer on which singulation lines(43,45) are formed. A first opening penetrates layers under the opening. A part of the surface of the semiconductor substrate is exposed. A first opening is etched to completely penetrate the semiconductor wafer. The opening in the singulation mask layer is used as a mask.
申请公布号 KR20110084828(A) 申请公布日期 2011.07.26
申请号 KR20110003406 申请日期 2011.01.13
申请人 SEMICONDUCTOR COMPONENTS INDUSTRIES, L.L.C. 发明人 GRIVNA GORDON M.;SEDDON MICHAEL J.
分类号 H01L21/78;H01L21/301 主分类号 H01L21/78
代理机构 代理人
主权项
地址