发明名称 Sample-and-hold circuit and CCD image sensor
摘要 Noise is more effectively reduced in one circuit. When sampling and holding is performed, switching of an ON resistance of MOS transistors (MSH1 and MSH2) that are for sampling is made in two or more stages according to speed of sampling. Here, a level adjustment circuit (20) is provided that generates sample-and-hold pulse signals (&phgr;SH1S and &phgr;SH2S), which vary voltage to enable switching the ON resistance of the MOS transistors (MSH1 and MSH2), to be provided to gates of the MOS transistors (MSH1 and MSH2).
申请公布号 US7986170(B2) 申请公布日期 2011.07.26
申请号 US20090407321 申请日期 2009.03.19
申请人 RENESAS ELECTRONICS CORPORATION 发明人 HARAGUCHI YOSHIZUMI
分类号 G11C27/02;H03K17/00;H04N1/028;H04N5/335;H04N5/357;H04N5/369;H04N5/372;H04N5/376;H04N5/378 主分类号 G11C27/02
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