METHODS OF USING TEMPERATURE CONTROL DEVICES IN ELECTRON MICROSCOPY
摘要
<p>Methods of using temperature control devices in electron microscopes. The temperature of the device structure may be controlled to extract information about reactions and processes that was previously unobtainable.</p>
申请公布号
WO2011038062(A3)
申请公布日期
2011.07.21
申请号
WO2010US49913
申请日期
2010.09.23
申请人
PROTOCHIPS, INC.;DAMIANO, JOHN;MICK, STEPHEN;NACKASHI, DAVID
