发明名称 SEMICONDUCTOR FIN DEVICE AND METHOD FOR FORMING THE SAME USING HIGH TILT ANGLE IMPLANT
摘要 An angled implantation process is used in implanting semiconductor fins of a semiconductor device and provides for covering some but not necessarily all of semiconductor fins of a first type with patterned photoresist, and implanting using an implant angle such that all semiconductor fins of a second type are implanted and none of the semiconductor fins of the first type, are implanted. A higher tilt or implant angle is achieved due to the reduced portions of patterned photoresist, that are used.
申请公布号 US2011175165(A1) 申请公布日期 2011.07.21
申请号 US20100689588 申请日期 2010.01.19
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 YU SHAO-MING;CHANG CHANG-YUN
分类号 H01L27/12;H01L21/20;H01L21/265;H01L27/088 主分类号 H01L27/12
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