发明名称 SEMICONDUCTOR SUBSTRATE PLANARIZATION APPARATUS AND PLANARIZATION METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a planarization apparatus that thins and planarizes a substrate by grinding and polishing the rear surface of the substrate with high throughput, and that fabricates a semiconductor substrate with reduced adhered contaminants. <P>SOLUTION: The planarization apparatus 1 houses various mechanism elements in a semiconductor substrate loading/unloading stage chamber 11a, a rear-surface polishing stage chamber 11c, and a rear-surface grinding stage chamber 11b. The throughput time of a rear-surface polishing stage 70 that simultaneously polishes two substrates is designed to be about double the throughput time of a rear-surface grinding stage 20 that grinds one substrate. <P>COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011142201(A) 申请公布日期 2011.07.21
申请号 JP20100001727 申请日期 2010.01.07
申请人 OKAMOTO MACHINE TOOL WORKS LTD 发明人 IDE SATORU;KASHIWA MORIYUKI;KOBAYASHI KAZUO;MOCHIMARU YORIYUKI;YAMAMOTO EIICHI;KIDA HIROAKI;KUBO TOMIO
分类号 H01L21/304;B24B9/00;B24B37/04;B24B37/10;B24B41/00;B24B41/06 主分类号 H01L21/304
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