发明名称 |
SEMICONDUCTOR SUBSTRATE PLANARIZATION APPARATUS AND PLANARIZATION METHOD |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a planarization apparatus that thins and planarizes a substrate by grinding and polishing the rear surface of the substrate with high throughput, and that fabricates a semiconductor substrate with reduced adhered contaminants. <P>SOLUTION: The planarization apparatus 1 houses various mechanism elements in a semiconductor substrate loading/unloading stage chamber 11a, a rear-surface polishing stage chamber 11c, and a rear-surface grinding stage chamber 11b. The throughput time of a rear-surface polishing stage 70 that simultaneously polishes two substrates is designed to be about double the throughput time of a rear-surface grinding stage 20 that grinds one substrate. <P>COPYRIGHT: (C)2011,JPO&INPIT |
申请公布号 |
JP2011142201(A) |
申请公布日期 |
2011.07.21 |
申请号 |
JP20100001727 |
申请日期 |
2010.01.07 |
申请人 |
OKAMOTO MACHINE TOOL WORKS LTD |
发明人 |
IDE SATORU;KASHIWA MORIYUKI;KOBAYASHI KAZUO;MOCHIMARU YORIYUKI;YAMAMOTO EIICHI;KIDA HIROAKI;KUBO TOMIO |
分类号 |
H01L21/304;B24B9/00;B24B37/04;B24B37/10;B24B41/00;B24B41/06 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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