| 摘要 |
A pattern identification apparatus identifies a pattern that exists in input data using registration data including data of a reference pattern or a feature amount thereof and identification parameters defining processing details for comparing the input data with the registration data, the apparatus holding the registration data and the identification parameters in association with a label. The apparatus acquires registration data, identification parameters, and a label generated by an external apparatus, and registers the acquired registration data and identification parameters in association with the acquired label. If the registration data and identification parameters associated with the same label as acquired label are already registered, in the additional registration, either the stated acquired identification parameters or the identification parameters that is already registered in association with the same label are selected, and the stated acquired registration data and the selected identification parameters are additionally registered in association with the acquired label.
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