发明名称 METHOD AND APPARATUS FOR MEASURING INTERNAL QUANTUM WELL EFFICIENCY OF LED
摘要 PURPOSE: A method and an apparatus for measuring the internal quantum well efficiency of an optical device are provided to measure the efficiency of a light emitting diode in a non-destructive manner at the normal temperature through optical excitation or current injection. CONSTITUTION: A method for measuring the internal quantum well efficiency of an optical device is as follows. The intensity of emitted light from the optical device is measured by applying excitation current to the optical device. The reference intensity of the excitation current where the variation of recombination coefficients according to the variation of carrier density within the quantum well of the optical device is minimum is extracted(S13). The internal quantum efficiency of the optical device at the reference excitation current intensity is calculated(S14,S15). The internal quantum efficiencies of the optical devices at different excitation current intensities are calculated from the internal quantum efficiency of the optical device at the reference excitation current intensity(S17).
申请公布号 KR20110083871(A) 申请公布日期 2011.07.21
申请号 KR20100003836 申请日期 2010.01.15
申请人 IUCF-HYU (INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY) 发明人 SHIM, JONG IN;KIM, HYUN SUNG
分类号 G01N21/63;G01M11/02 主分类号 G01N21/63
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