PROBE FOR ELECTRICAL TEST AND METHOD FOR MANUFACTURING THE SAME, AND ELECTRICAL CONNECTING APPARATUS AND METHOD FOR MANUFACTURING THE SAME

摘要

PURPOSE: A probe for an electrical test and a manufacturing method thereof, and an electrical connecting apparatus and a manufacturing method thereof are provided to easily specify the location of a probe in a substrate by presetting the relation between the location of the probe in the substrate and the symbol recorded in the probe. CONSTITUTION: A base part(48a) is combined in a substrate. A faraday dark space part(48b) is horizontally extended to the bottom part of the base. A needle part(48c) is projected downward from the tip end part of the faraday dark space part. The needle part is connected with the lower side of the base substrate on the seat in the upper side of the base. The probe which is selected from the base, the faraday dark space part, and the needle part contains a specific symbol which indicates the location of the probe on the substrate. The faraday dark space part has a prismatic structure. A symbol is formed in the faraday dark space part.